Merni sistemASML
YieldStar S-200B
Merni sistem
ASML
YieldStar S-200B
godina proizvodnje
2011
Stanje
Polovno
Lokacija
Dresden 

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Podaci o mašini
- Naziv mašine:
- Merni sistem
- Proizvođač:
- ASML
- Model:
- YieldStar S-200B
- Godina proizvodnje:
- 2011
- Stanje:
- vrlo dobro (rabljeno)
- Funkcionalnost:
- potpuno funkcionalan
Cijena i lokacija
- Lokacija:
- Heilbronner Str. 22, 01189 Dresden, Deutschland

Pozovite
Detalji ponude
- ID oglasa:
- A19967480
- Referentni broj:
- DV10125
- Ažuriranje:
- posljednji put 10.09.2025
Opis
Optical overlay metrology system, Advanced Semiconductor Materials Lithography stand-alone overlay metrology system for 300 mm wafers, YieldStar S 200B
Tjdpexbnt Ejfx Ad Hef
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General information:
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.
Oglas je automatski preveden. Moguće su greške u prijevodu.
Tjdpexbnt Ejfx Ad Hef
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General information:
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.
Oglas je automatski preveden. Moguće su greške u prijevodu.
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