Mjerni mikroskop HITEC QZW 1, 250 × 170 mm

HITEC Messtechnik Messmikroskop QZW 1 M3 Software

We are offering a top-class QZW 1 measuring microscope from HITEC
Type: 250 x 170 mm

M3 software features:
- Automatic edge detection
- Tolerance verification according to DIN/ISO
- Element view with tolerance input
- Part view with dimensioning
- Live image display during measurement
- Additional image storage for your documentation

Dell touch PC with Windows 10 (upgradeable to Windows 11)
Calibration certificate valid until 31.07.2025

MEASURING RANGE X-, Y-AXIS: 250 x 170 mm
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LENGTH DEVIATION: 1.9 μm + L/100 (L in mm)
MEASURING RANGE Z-AXIS: 150 mm
MEASURING SYSTEM Z-AXIS: Optional
CAMERA
USB 3.0, 25 frames/s, 2.0 megapixels
OBJECTIVE LENS
Fixed lens / optional zoom lens 0.7x - 4.5x (manual/motorized)
MAGNIFICATION
40x or 35x - 225x (zoom lens)
FIELD OF VIEW
8 mm or 9 mm - 1.5 mm (zoom lens)
SURFACE LIGHT
4-segment LED ring light (optional coaxial surface light)
TRANSMITTED LIGHT
LED (optional telecentric)
POSITIONING
Laser pointer
TABLE LOAD CAPACITY
Max. 20 kg
DELIVERY CONTENT
QZW1, 23" touchscreen PC, M3 software, calibration certificate, operation manual

Applications
The QZW1 product line supports you in highly precise and repeatable measurements of complex workpieces made from all materials. With numerous options such as a zoom lens, different Z-axis lengths, and various measuring table sizes, the QZW1 offers full flexibility for your part-specific measuring requirements.

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